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[IEEE 2000 IEEE Radiation Effects Data Workshop. Workshop Record - Reno, NV, USA (24-28 July 2000)] 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) - A rad-hard analog CMOS cell library

✍ Scribed by Hogue, D.R.; Perry, G.A.; Rumel, S.R.; Bonebright, R.; Braatz, J.C.; Baze, M.P.; Holic, J.

Book ID: 126185028
Publisher: IEEE
Year: 2000
Weight: 288 KB
Edition: 1
Category: Article
ISBN-13: 9780780364745
DOI: 10.1109/REDW.2000.896264

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