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[IEEE 2000 IEEE Radiation Effects Data Workshop. Workshop Record - Reno, NV, USA (24-28 July 2000)] 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) - Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators

✍ Scribed by Koga, R.; Crain, S.H.; Crawford, K.B.; Moss, S.C.; LaLumondiere, S.D.; Howard, J.W.

Book ID: 117998850
Publisher: IEEE
Year: 2000
Weight: 534 KB
Edition: 1
Volume: 0
Category: Article
ISBN-13: 9780780364745
DOI: 10.1109/redw.2000.896269

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