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[IEEE 2000 IEEE Nuclear Science Symposium. Conference Record - Lyon, France (15-20 Oct. 2000)] 2000 IEEE Nuclear Science Symposium. Conference Record (Cat. No.00CH37149) - Equipment and methods for rapid analysis of PWO full size scintillation crystals radiation hardness at mass production

✍ Scribed by Annenkov, A.; Auffray, E.; Drobychev, G.; Fedorov, A.; Ivankin, P.; Korzhik, M.; Lecoq, P.; Ligun, V.; Lopatik, A.; Matveev, L.; Missevitch, O.; Zouevski, R.; Peigneux, J.-P.; Sigovski, A.

Book ID: 115529922
Publisher: IEEE
Year: 2000
Weight: 394 KB
Volume: 1
Category: Article
ISBN-13: 9780780365032
DOI: 10.1109/nssmic.2000.949187

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