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[IEEE 2000 IEEE Nuclear Science Symposium. Conference Record - Lyon, France (15-20 Oct. 2000)] 2000 IEEE Nuclear Science Symposium. Conference Record (Cat. No.00CH37149) - Trends in CMOS technologies and radiation tolerant design

✍ Scribed by Anelli, G.

Book ID: 118208586
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 35 KB
Volume: 1
Category: Article
ISBN-13: 9780780365032
DOI: 10.1109/nssmic.2000.948989

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