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[IEEE 1999 International Symposium on Electromagnetic Compatibility (EMC'99) - Seattle, WA, USA (2-6 Aug. 1999)] 1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) - The effect of cable geometry on the reproducibility of EMC measurements

✍ Scribed by Van Wershoven, L.

Book ID: 126767457
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 527 KB
Edition: 1999 ed.
Volume: 2
Category: Article
ISBN-13: 9780780350571
DOI: 10.1109/ISEMC.1999.810118

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