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[IEEE 1999 International Symposium on Electromagnetic Compatibility (EMC'99) - Seattle, WA, USA (2-6 Aug. 1999)] 1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261) - Effect of lead length on the response of ESD protection devices

✍ Scribed by Fallah, A.M.; Nelson, R.M.

Book ID: 126670743
Publisher: IEEE
Year: 1999
Weight: 612 KB
Volume: 2
Category: Article
ISBN-13: 9780780350571
DOI: 10.1109/ISEMC.1999.810202

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