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[IEEE 1999 IEEE International SOI Conference. Proceedings - Rohnert Park, CA, USA (4-7 Oct. 1999)] 1999 IEEE International SOI Conference. Proceedings (Cat. No.99CH36345) - High frequency characterization of SOI dynamic threshold voltage MOS (DTMOS) transistors

✍ Scribed by Ferlet-Cavrois, V.; Bracale, A.; Fel, N.; Musseau, O.; Raynaud, C.; Faynot, O.; Pelloie, J.L.

Book ID: 126710216
Publisher: IEEE
Year: 1999
Weight: 142 KB
Edition: 1999
Category: Article
ISBN-13: 9780780354562
DOI: 10.1109/SOI.1999.819840

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