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[IEEE 1999 IEEE International SOI Conference. Proceedings - Rohnert Park, CA, USA (4-7 Oct. 1999)] 1999 IEEE International SOI Conference. Proceedings (Cat. No.99CH36345) - Mechanisms of dynamic pass leakage current in partially depleted SOI MOSFETs

✍ Scribed by Saraya, T.; Hiramoto, T.

Book ID: 126634753
Publisher: IEEE
Year: 1999
Weight: 146 KB
Category: Article
ISBN-13: 9780780354562
DOI: 10.1109/SOI.1999.819864

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