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[IEEE 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 - Fontevraud, France (13-17 Sept. 1999)] 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) - Total dose behavior of partially depleted SOI dynamic threshold voltage MOS (DTMOS) for very low supply voltage applications (0.6-1 V)

✍ Scribed by Ferlet-Cavrois, V.; Paillet, P.; Musseau, O.; Leray, J.L.; Faynot, O.; Raynaud, C.; Pelloie, J.L.

Book ID: 126683626
Publisher: IEEE
Year: 2000
Weight: 723 KB
Category: Article
ISBN-13: 9780780357266
DOI: 10.1109/RADECS.1999.858600

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