𝔖 Bobbio Scriptorium

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[IEEE 1998 IEEE MTT-S International Microwave Symposium Digest (Cat. No.98CH36192) - Baltimore, MD, USA (7-12 June 1998)] 1998 IEEE MTT-S International Microwave Symposium Digest (Cat. No.98CH36192) - Accurate extraction method for 1/f-noise parameters used in Gummel-Poon type bipolar junction transistor models

✍ Scribed by Sinnesbichler, F.X.; Fischer, M.; Olbrich, G.R.

Book ID: 120228495
Publisher: IEEE
Year: 1998
Weight: 359 KB
Volume: 3
Category: Article
ISBN-13: 9780780344716
DOI: 10.1109/MWSYM.1998.700623

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