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[IEEE 1998 IEEE MTT-S International Microwave Symposium Digest (Cat. No.98CH36192) - Baltimore, MD, USA (7-12 June 1998)] 1998 IEEE MTT-S International Microwave Symposium Digest (Cat. No.98CH36192) - Modeling of correlated noise in RF bipolar devices

✍ Scribed by Martin, S.; Booth, R.; Chyan, Y.-F.; Frei, M.; Goldthorp, D.; Lee, K.H.; Moinian, S.; Ng, K.; Subramaniam, P.

Book ID: 120056729
Publisher: IEEE
Year: 1998
Weight: 279 KB
Volume: 2
Category: Article
ISBN-13: 9780780344716
DOI: 10.1109/MWSYM.1998.705146

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