✦ LIBER ✦

[IEEE 1998 IEEE International SOI Conference Proceedings - Stuart, FL, USA (5-8 Oct. 1998)] 1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) - Defect free deep trench isolation for high voltage bipolar application on SOI wafer

✍ Scribed by Yindepol, W.; Bashir, R.; McGregor, J.M.; Brown, K.C.; De Wolf, I.; De Santis, J.; Ahmed, A.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 1998 IEEE International SOI Confer

✍ Adan, A.O.; Naka, T.; Kagisawa, A.; Shimizu, H. 📂 Article 📅 1998 🏛 IEEE ⚖ 380 KB

[IEEE 1998 IEEE International SOI Confer

✍ Zhao, Y.-F.; Huang, A.Q.; Leung, Y.-K.; Wong, S.S. 📂 Article 📅 1998 🏛 IEEE ⚖ 218 KB

[IEEE 1998 IEEE International SOI Confer

✍ Banet, M.; Allen, L.P.; Nelson, K.A.; Fuchs, M.; Rogers, J.A.; Akthukal, A.; Maz 📂 Article 📅 1998 🏛 IEEE ⚖ 227 KB

[IEEE 1998 IEEE International SOI Confer

✍ Ernst, T.; Cristoloveanu, S.; Vandooren, A.; Colinge, J.-P.; Rudenko, T.E. 📂 Article 📅 1998 🏛 IEEE ⚖ 212 KB

[IEEE 1998 IEEE International SOI Confer

✍ Hui, F.; Chen, Z.; Shen, K.; Lau, J.; Huang, M.; Chan, M.; Ko, P.K.; Jin, G.; Ch 📂 Article 📅 1998 🏛 IEEE ⚖ 276 KB

[IEEE 1998 IEEE International SOI Confer

✍ Moriceau, H.; Cartier, A.M.; Aspar, B. 📂 Article 📅 1998 🏛 IEEE ⚖ 292 KB