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[IEEE 1998 Fourth International High Temperature Electronics Conference. HITEC - Albuquerque, NM, USA (14-18 June 1998)] 1998 Fourth International High Temperature Electronics Conference. HITEC (Cat. No.98EX145) - High temperature die-attach effects on die stresses

✍ Scribed by Shun-Tien Lin, ; Benoit, J.T.; Grzybowski, R.R.; Zou, Y.; Suhling, J.C.; Jaeger, R.C.

Book ID: 118145607
Publisher: IEEE
Year: 1998
Weight: 697 KB
Volume: 0
Category: Article
ISBN-13: 9780780345409
DOI: 10.1109/hitec.1998.678199

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