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[IEEE 1998 Annual Report Conference on Electrical Insulation and Dielectric Phenomena - Atlanta, GA, USA (25-28 Oct. 1998)] 1998 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.98CH36257) - A review of possible degradation mechanisms of silicone elastomers in high voltage insulation applications

✍ Scribed by Goudie, J.L.; Owen, M.J.; Orbeck, T.

Book ID: 121732851
Publisher: IEEE
Year: 1998
Weight: 786 KB
Volume: 1
Category: Article
ISBN-13: 9780780350359
DOI: 10.1109/CEIDP.1998.733878

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