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[IEEE 1998 Annual Report Conference on Electrical Insulation and Dielectric Phenomena - Atlanta, GA, USA (25-28 Oct. 1998)] 1998 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.98CH36257) - PD-pattern recognition of on-site-measurement data

✍ Scribed by Badent, R.; Rudolph, O.; Zierhut, W.; Breuer, A.; Schwab, A.J.

Book ID: 118063351
Publisher: IEEE
Year: 1998
Weight: 341 KB
Volume: 0
Category: Article
ISBN-13: 9780780350359
DOI: 10.1109/ceidp.1998.732914

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