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[IEEE 1997 International Semiconductor Conference 20th Edition. CAS '97 Proceedings - Sinaia, Romania (7-11 Oct. 1997)] 1997 International Semiconductor Conference 20th Edition. CAS '97 Proceedings - Complex studies of porous silicon aging phenomena

✍ Scribed by Torchinskaya, T.V.; Korsunskaya, N.E.; Khomenkova, L.Yu.; Sheinkman, M.K.; Baran, N.P.; Misiuk, A.; Surma, B.

Book ID: 117998856
Publisher: IEEE
Year: 1997
Tongue: English
Weight: 292 KB
Edition: 1997
Volume: 1
Category: Article
ISBN-13: 9780780338043
DOI: 10.1109/smicnd.1997.651574

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