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[IEEE 1997 International Semiconductor Conference 20th Edition. CAS '97 Proceedings - Sinaia, Romania (7-11 Oct. 1997)] 1997 International Semiconductor Conference 20th Edition. CAS '97 Proceedings - Accuracy improvements in microwave transistor noise parameters extraction

✍ Scribed by Vasilescu, G.; Alquie, G.

Book ID: 117996664
Publisher: IEEE
Year: 1997
Tongue: English
Weight: 278 KB
Edition: 1997
Volume: 2
Category: Article
ISBN-13: 9780780338043
DOI: 10.1109/smicnd.1997.651186

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