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[IEEE 1996 IEEE International SOI Conference Proceedings - Sanibel Island, FL, USA (30 Sept.-3 Oct. 1996)] 1996 IEEE International SOI Conference Proceedings - Effect of annealing sequences on the structure of buried oxide layer in low-dose SIMOX

✍ Scribed by Sudou, M.; Kainuma, M.; Arai, K.; Takamatsu, M.; Nakai, T.; Shingyouji, T.; Cordts, B.

No coin nor oath required. For personal study only.

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