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[IEEE 1995 IEEE 5th International Conference on Conduction and Breakdown in Solid Dielectrics - Leicester, UK (10-13 July 1995)] Proceedings of 1995 IEEE 5th International Conference on Conduction and Breakdown in Solid Dielectrics - Analysis of internal partial discharges in solid dielectrics using an electro-optical measurement system

✍ Scribed by Guzman, H.; Kranz, H.-G.

Book ID: 118029724
Publisher: IEEE
Year: 1995
Weight: 339 KB
Volume: 0
Category: Article
ISBN-13: 9780780320406
DOI: 10.1109/icsd.1995.522985

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