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[IEEE 1995 IEEE 5th International Conference on Conduction and Breakdown in Solid Dielectrics - Leicester, UK (10-13 July 1995)] Proceedings of 1995 IEEE 5th International Conference on Conduction and Breakdown in Solid Dielectrics - Stochastic analysis of partial discharge patterns deriving from electrical tree measurements

โœ Scribed by Bozzo, R.; Contin, A.; Cacciari, M.; Guastavino, F.; Gemme, E.; Montanari, G.C.


Book ID
118018873
Publisher
IEEE
Year
1995
Weight
310 KB
Volume
0
Category
Article
ISBN-13
9780780320406

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