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[IEEE 1994 IEEE International Electron Devices Meeting - San Francisco, CA, USA (11-14 Dec. 1994)] Proceedings of 1994 IEEE International Electron Devices Meeting - Comparison of self-heating effects in bulk-silicon and SOI high-voltage devices

โœ Scribed by Arnold, E.; Pein, H.; Herko, S.P.


Book ID
127159747
Publisher
IEEE
Year
1994
Weight
350 KB
Category
Article
ISBN-13
9780780321113

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