𝔖 Bobbio Scriptorium

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[IEEE 1994 IEEE International Electron Devices Meeting - San Francisco, CA, USA (11-14 Dec. 1994)] Proceedings of 1994 IEEE International Electron Devices Meeting - Simulation of advanced field isolation using calibrated viscoelastic stress analysis

✍ Scribed by Senez, V.; Collard, D.; Ferreira, P.; Baccus, B.

Book ID: 126607338
Publisher: IEEE
Year: 1994
Weight: 489 KB
Category: Article
ISBN-13: 9780780321113
DOI: 10.1109/IEDM.1994.383272

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