𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 1994 IEEE International Electron Devices Meeting - San Francisco, CA, USA (11-14 Dec. 1994)] Proceedings of 1994 IEEE International Electron Devices Meeting - Determination of ultra-thin gate oxide thicknesses for CMOS structures using quantum effects

✍ Scribed by Rios, R.; Arora, N.D.

Book ID: 121307920
Publisher: IEEE
Year: 1994
Weight: 330 KB
Category: Article
ISBN-13: 9780780321113
DOI: 10.1109/IEDM.1994.383335

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