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[IEEE 1993 IEEE Instrumentation and Measurement Technology Conference - Irvine, CA, USA (18-20 May 1993)] 1993 IEEE Instrumentation and Measurement Technology Conference - Experimental design of exit wave reconstruction from a transmission electron microscope defocus series

✍ Scribed by Miedema, M.A.O.; van den Bos, A.; Buist, A.H.

Book ID: 126689120
Publisher: IEEE
Year: 1993
Weight: 467 KB
Category: Article
ISBN-13: 9780780312296
DOI: 10.1109/IMTC.1993.382595

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