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[IEEE 1993 IEEE Instrumentation and Measurement Technology Conference - Irvine, CA, USA (18-20 May 1993)] 1993 IEEE Instrumentation and Measurement Technology Conference - Pattern recognition based on fuzzy logic

✍ Scribed by Schmalzel, J.L.; Johnson, J.F.

Book ID: 121849982
Publisher: IEEE
Year: 1993
Weight: 310 KB
Category: Article
ISBN-13: 9780780312296
DOI: 10.1109/IMTC.1993.382557

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