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[IEEE [1992 Proceedings] Eighth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - Austin, TX, USA (3-5 Feb. 1992)] [1992 Proceedings] Eighth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - A comparison of two-dimensional planar, axisymmetric and three-dimensional spreading resistances

✍ Scribed by Nelson, D.J.; Sayers, W.A.

Book ID: 126669381
Publisher: IEEE
Year: 1992
Weight: 534 KB
Category: Article
ISBN-13: 9780780305007
DOI: 10.1109/STHERM.1992.172852

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