๐”– Bobbio Scriptorium
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[IEEE 1991, International Test Conference - Nashville, TN (Oct. 26-30 1991)] 1991, Proceedings. International Test Conference - A Methodology for Designing Optimal Self-Checking Sequential Circuits

โœ Scribed by Parekhji, R.A.; Venkatesh, G.; Sherlekar, S.D.


Book ID
126676896
Publisher
IEEE
Year
1991
Weight
800 KB
Category
Article
ISBN-13
9780818691560

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