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[IEEE 1991, International Test Conference - Nashville, TN (Oct. 26-30 1991)] 1991, Proceedings. International Test Conference - CMOS BRIDGING FAULT DETECTION

✍ Scribed by Storey, T.M.; Maly, W.

Book ID: 126646547
Publisher: IEEE
Year: 1991
Weight: 966 KB
Category: Article
ISBN-13: 9780818691560
DOI: 10.1109/TEST.1991.519796

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