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[IEEE 1988 Bipolar Circuits and Technology Meeting, - Minneapolis, MN, USA (12-13 Sept. 1988)] Proceedings of the 1988 Bipolar Circuits and Technology Meeting, - Characterization of polysilicon contacts by photoconductance measurements

✍ Scribed by Jalali, B.; Yang, E.S.

No coin nor oath required. For personal study only.

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