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[IEEE 1988 Bipolar Circuits and Technology Meeting, - Minneapolis, MN, USA (12-13 Sept. 1988)] Proceedings of the 1988 Bipolar Circuits and Technology Meeting, - GHz on-silicon-wafer probing calibration methods

✍ Scribed by Fraser, A.; Gleason, R.; Strid, E.W.

No coin nor oath required. For personal study only.

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