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[IEEE 17th International Zurich Symposium on Electromagnetic Compatibility - Singapore (2006.02.27-2006.03.3)] 2006 17th International Zurich Symposium on Electromagnetic Compatibility - Simulation of integrated circuit immunity with LECCS model

✍ Scribed by Ichikawa, K.; Inagaki, M.; Sakurai, Y.; Iwase, I.; Nagata, M.; Wada, O.

Book ID: 126268855
Publisher: IEEE
Year: 2006
Weight: 303 KB
Category: Article
ISBN-13: 9783952299036
DOI: 10.1109/EMCZUR.2006.214932

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