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[IEEE 17th International Zurich Symposium on Electromagnetic Compatibility - Singapore (2006.02.27-2006.03.3)] 2006 17th International Zurich Symposium on Electromagnetic Compatibility - Radiated electric field strength from high-power microwave systems

✍ Scribed by Larsson, A.; Johansson, B.; Nyholm, S.E.

Book ID: 120174007
Publisher: IEEE
Year: 2006
Weight: 269 KB
Category: Article
ISBN-13: 9783952299036
DOI: 10.1109/EMCZUR.2006.214966

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