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[IEEE 17th IEEE Instrumentation and Measurement Technology Conference - Baltimore, MD, USA (1-4 May 2000)] Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066] - A novel automated measurement and control system based on VXIbus for I&D logic analysis

✍ Scribed by Zhang Hongxuan, ; Zhu Yisheng, ; Wang Wi,

Book ID: 126642377
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 348 KB
Edition: 1
Volume: 3
Category: Article
ISBN-13: 9780780358904
DOI: 10.1109/IMTC.2000.848698

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