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[IEEE 17th IEEE Instrumentation and Measurement Technology Conference - Baltimore, MD, USA (1-4 May 2000)] Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066] - Research on multi-parameter transducer and Integrated Measurement System (IMS)

✍ Scribed by Wendong Zhang, ; Haifeng Dong, ; Jijun Xiong, ; Shenshu Xiong,

Book ID: 120216240
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 386 KB
Edition: 1
Volume: 3
Category: Article
ISBN-13: 9780780358904
DOI: 10.1109/IMTC.2000.848715

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