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[IEEE 16th IEEE International Symposium on Software Reliability Engineering (ISSRE'05) - Chicago, IL, USA (08-11 Nov. 2005)] 16th IEEE International Symposium on Software Reliability Engineering (ISSRE'05) - Software Defect Rediscoveries: A Discrete Lognormal Model

✍ Scribed by Mullen, R.E.; Gokhale, S.S.

Book ID: 126994877
Publisher: IEEE
Year: 2005
Weight: 157 KB
Category: Article
ISBN-13: 9780769524825
DOI: 10.1109/issre.2005.37

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