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[IEEE 13th Asian Test Symposium - Kenting, Taiwan (15-17 Nov. 2004)] 13th Asian Test Symposium - A Novel Approach for On-line Testable Reversible Logic Circuit Design

โœ Scribed by Vasudevan, D.P.; Lala, P.K.; Parkerson, J.P.


Book ID
121878186
Publisher
IEEE
Year
2004
Weight
255 KB
Category
Article
ISBN-13
9780769522357

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