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[IEEE 13th Asian Test Symposium - Kenting, Taiwan (15-17 Nov. 2004)] 13th Asian Test Symposium - Max-Testable Class of Sequential Circuits having Combinational Test Generation Complexity

✍ Scribed by Das, D.K.; Inoue, T.; Chakraborty, S.; Fujiwara, H.

No coin nor oath required. For personal study only.

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