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[IEEE 10th International Semiconducting and Insulating Materials - Berkeley, CA, USA (1-5 June 1998)] Semiconducting and Insulating Materials 1998. Proceedings of the 10th Conference on Semiconducting and Insulating Materials (SIMC-X) (Cat. No.98CH36159) - A new technique for the detection of structural defects in SiC bulk crystals

✍ Scribed by Argunova, T.S.; Baruchel, J.; Hartwig, J.

Book ID: 126757599
Publisher: IEEE
Year: 1998
Weight: 229 KB
Category: Article
ISBN-13: 9780780343542
DOI: 10.1109/SIM.1998.785127

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