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Identification of vacancy complexes in Si by positron annihilation

✍ Scribed by Saarinen, K; Ranki, V

Book ID
111867236
Publisher
Institute of Physics
Year
2003
Tongue
English
Weight
187 KB
Volume
15
Category
Article
ISSN
0953-8984

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## Abstract The species of defects in Mg~0.5~Zn~0.5~Te, Li‐doped and P‐doped ZnTe samples were investigated by using positron‐based experiments. The positron lifetime experiments along with the atomic superposition (AT‐SUP) method were used to predict the positron trapping centers in the samples. T