Identification of different imperfections by measurement of thermal resistivity in high purity copper

✍ Scribed by V. Gröger

• Book ID: 103053110
• Publisher: Elsevier Science
• Year: 1980
• Tongue: English
• Weight: 187 KB
• Volume: 20
• Category: Article
• ISSN: 0011-2275
• DOI: 10.1016/0011-2275(80)90010-7

✦ Synopsis

Low temperature measurements of thermal resistivity of high purity copper foils with different concentrations of iron impurities in the ppm range are carried out after internal oxidation. By comparison with samples containing different contents of oxidized iron impurities and samples with point defects produced by mechanical deformation, it can be shown that the deviations from Matthiessen" rule for thermal resistivities are characteristic for the kind of "extra" point defects in the lowest concentration range.

Identification of different imperfections by measurement of thermal resistivity in high purity copper

V. Gr6ger