✦ LIBER ✦

IBIC and IBIL microscopy applied to advanced semiconductor materials

✍ Scribed by C. Manfredotti; F. Fizzotti; P. Polesello; E. Vittone; M. Truccato; A. Lo Giudice; M. Jaksic; P. Rossi

Book ID: 114169758
Publisher: Elsevier Science
Year: 1998
Tongue: English
Weight: 694 KB
Volume: 136-138
Category: Article
ISSN: 0168-583X
DOI: 10.1016/s0168-583x(97)00829-x

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