Charge transfer in the Ni/SiOx/n-Si(111)
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B. Viswanathan; Katsumi Tanaka; I. Toyoshima
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Article
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1985
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Elsevier Science
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English
β 536 KB
Bmding energies of the core level (Ni 2P3f~I and IMh% Auger peak have been measured For the system Ni/SiOJp or n-Si(lll) with different coverages of nickel-The Auger parameter was used to evaluate the re&xation shirt from which the extent of chemical shift was deduced Tbe binding energy shirt has be