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Hydrogenation of lithium- and calcium-related defect centers in silicon

✍ Scribed by C Häβler; T Dalibor; G Pensl; W Zulehner


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
102 KB
Volume
93
Category
Article
ISSN
0038-1098

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## Dedicated to Professor Dr. Wolfgang Schro È ter on the occasion of his 65th anniversary The effective lifetime of charge carriers t eff in multicrystalline silicon (mc-Si) Baysix 1 wafers (in our case: Bridgman-type) cut from areas close above the ingot bottom is reduced (t eff < 1 ms). However