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Hydrogen detection by secondary ion mass spectroscopy: Hydrogen on polycrystalline nickel

✍ Scribed by A. Benninghoven; P. Beckmann; D. Greifendorf; K.-H. Müller; M. Schemmer


Book ID
104190683
Publisher
Elsevier Science
Year
1981
Weight
81 KB
Volume
107
Category
Article
ISSN
0167-2584

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## Abstract For the analysis of hydrogen and helium in solids and thin films by secondary ion mass spectrometry, the use of Cs^+^ primary ions in conjunction with the detection of HCs^+^ and HeCs^+^ molecular ions is proposed. For both species, detection limits of the order of 10^19^ atoms cm^−3^ a