Hybrid Microcircuit Reliability Data

Publisher: Pergamon Press
Year: 1976
Tongue: English
Leaves: 210
Category: Library

No coin nor oath required. For personal study only.

✦ Table of Contents

Content:
Some Pergamon Books of Interest, Page ii
Front Matter, Page iii
Copyright, Page iv
INTRODUCTION, Page 1, IIT RESEARCH INSTITUTE
SECTION 1 - EXPERIENCED vs PREDICTED FAILURE RATES, Pages 2-5, IIT RESEARCH INSTITUTE
SECTION 2 - SCREENING SUMMARY, Pages 6-11, IIT RESEARCH INSTITUTE
SECTION 3 - FAILURE CLASSIFICATIONS, Pages 12-14, IIT RESEARCH INSTITUTE
SECTION 4 - CROSS REFERENCE INDEX, Pages 15-20, IIT RESEARCH INSTITUTE
SECTION 5 - DETAILED TEST DATA TABULATION, Pages 21-202, IIT RESEARCH INSTITUTE
HYBRID MICROCIRCUIT DESCRIPTOR CODE INTERPRETATIONS, Pages 204-208

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