Humidity effects on adhesion strength between solder ball and epoxy underfills
โ Scribed by C.E. Park; B.J. Han; H.E. Bair
- Publisher
- Elsevier Science
- Year
- 1997
- Tongue
- English
- Weight
- 819 KB
- Volume
- 38
- Category
- Article
- ISSN
- 0032-3861
No coin nor oath required. For personal study only.
โฆ Synopsis
The curing behaviour and the development of physical properties of three commercial, silica filled epoxy/ anhydride resins that are used in solder 'flip-chip' technology were investigated by differential scanning calorimetry, dynamic mechanical analysis (d.m.a.) and Fourier transform infra-red (FTi.r.) spectroscopy. In particular it was found that if the uncured resins were aged in the presence of moisture at 23ยฐC and then cured, the resulting properties such as glass transition temperature and rubbery modulus were significantly lower than the ultimate properties which developed if the resins were stored in the absence of water and then reacted. Also, under elevated temperatures and in the presence of high humidities or steam the hydrolysis of fully cured resins which had been previously stored in a dry state was detected by FTi.r. and d.m.a. measurements. The adhesion strength between solder balls and these epoxy underfill materials was found to deteriorate when aged under humid conditions.
๐ SIMILAR VOLUMES
The effects of plasma treatment on the surfaces of the flame resistant-4 (FR-4) and copper substrates are investigated in terms of X-ray photoelectron spectroscopy (XPS), contact angle, and atomic force microscopy (AFM). The adhesion strengths of the underfills/FR-4 substrate and underfills/copper s
Copper (Cu) was sputtered onto a polyetheretherketon (PEEK) film and onto three types of polyimide (PI) films; pyromellitic dianhydride-oxydianiline (PMDA-ODA), biphenyl dianhydride-para-phenylene diamine (BPDA-PDA) and biphenyl dianhydride-oxydianiline (BPDA-ODA). All films were pre-treated with ox