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HRTEM study of strained Si/Ge multilayers

✍ Scribed by M Romeo; C Uhlaq-Bouillet; J.P Deville; J Werckmann; G Ehret; R Chelly; D Dentel; T Angot; J.L Bischoff

Book ID: 108389319
Publisher: Elsevier Science
Year: 1998
Tongue: English
Weight: 837 KB
Volume: 319
Category: Article
ISSN: 0040-6090
DOI: 10.1016/s0040-6090(97)01115-2

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