Hot electron noise in n-channel JFETs between 150 and 300°K

✍ Scribed by S.K. Kim; A. van der Ziel; L.M. Rucker

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 101 KB
• Volume: 21
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(78)90375-1