Hot electron induced degradation of N-channel IGFETs : S. A. Abbas and R. C. Dokerty. Proc. IEEE Reliab. Phys. 38 (1976)

• Book ID: 103274309
• Publisher: Elsevier Science
• Year: 1977
• Tongue: English
• Weight: 116 KB
• Volume: 16
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(77)90029-4