✦ LIBER ✦
Reliability implications of hot electron generation and parasitic bipolar action in an IGFET device : S. A. Abbas and E. E. Davidson. Proc. IEEE Reliab. Phys. 18 (1976)
- Publisher
- Elsevier Science
- Year
- 1977
- Tongue
- English
- Weight
- 116 KB
- Volume
- 16
- Category
- Article
- ISSN
- 0026-2714
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